Symposium D-10
Innovative Imaging Technologies using X-ray Scattering and Atom Probe Microscopy
Partly supported by the Japan Society of Applied Physics (JSAP) Kyushu Chapter
Organizers
Representative Person1
- Yoshifumi SUZUKI
- Kyushu Institute of Technology
Co-Organizers
- Ryusuke NISHITANI
- Kyushu Institute of Technology
- Kazuhiro HARA
- Kyushu University
- Nobuyasu HIRAMATU
- Fukuoka University
- Kiyofumi NAGATA
- Fukuoka University
- Zhen-Chao DONG
- Hefei National Laboratory for Physical Sciences at Microscale University of Science and Technology of China (USTC)
Correspondence
- Yoshifumi SUZUKI
- Kyushu Institute of Technology（ysuzuki@e-lab.kyutech.ac.jp）
Scope
Materials characterization and development of new techonlogy are ones of the major aspects of the materials science by which interior of the materials probed and properties and structures of the materials are explained. Accordingly, characterization requires external techniques to probe into the inside as well as the fundamental scientific knowledge to interpret the signals. Technological developments allow various ways of exploring the internal structures and obtaining vast ranges of information.
Topics
- X-ray Imaging
- X-ray Small Angle Scattering
- Scanning Microscopy
- Surface and Interface Characterization
- Innovative Imaging Technologies
Invited Speakers
- Zhenchao DONG
- University of Science and Technology of China
- Yeukuang HWU
- Institute of Physics, Academia Sinica